Publikationen

Reaction-diffusion study of electron-beam-induced contamination growth
Müller, E.; Adrion, K.; Hugenschmidt, M.; Gerthsen, D.
2024. Ultramicroscopy, 264, Article no: 113995. doi:10.1016/j.ultramic.2024.113995

Electron-Beam-Induced Carbon Contamination in STEM-in-SEM: Quantification and Mitigation
Hugenschmidt, M.; Adrion, K.; Marx, A.; Müller, E.; Gerthsen, D.
2023. Microscopy and Microanalysis, 29 (1), 219–234. doi:10.1093/micmic/ozac003

Carbon‐film‐based Zernike phase plates with smooth thickness gradient for phase‐contrast transmission electron microscopy with reduced fringing artefacts
Obermair, M.; Hettler, S.; Dries, M.; Hugenschmidt, M.; Spiecker, R.; Gerthsen, D.
2022. Journal of Microscopy, 287 (1), 45–58. doi:10.1111/jmi.13108

Scanning electron microscopy micrograph of a ZIF-8 particle
Hugenschmidt, M.
2022. doi:10.5445/IR/1000145375

Scanning Transmission Electron Microscopy in a Scanning Electron Microscope: Electron-Beam Broadening, Contamination, and Investigation of ZIF-8 by Correlative Electron Microscopy. Dissertation
Hugenschmidt, M.
2022, April 5. Karlsruher Institut für Technologie (KIT). doi:10.5445/IR/1000144435

Impact of synthesis conditions on the morphology and crystal structure of tungsten nitride nanomaterials
Wenzel, O.; Rein, V.; Hugenschmidt, M.; Schilling, F.; Feldmann, C.; Gerthsen, D.
2021. RSC Advances, 11 (45), 28198–28210. doi:10.1039/d1ra04448f

Direct Synthesis of ZIF-8 on Transmission Electron Microscopy Grids Allows Insights into the Growth Process
Hugenschmidt, M.; Kutonova, K.; Valadez Sánchez, E. P.; Moulai, S.; Gliemann, H.; Bräse, S.; Wöll, C.; Gerthsen, D.
2021, August 24. Microscopy Conference (MC 2021), Online, 22.–26. August 2021

Fast Determination of the Thickness of Electron-Transparent Specimens using Quantitative STEM-in-SEM and Monte-Carlo Simulations
Adrion, K.; Hugenschmidt, M.; Müller, E.; Gerthsen, D.
2021, August 26. Microscopy Conference (MC 2021), Online, 22.–26. August 2021

Electron-beam broadening in electron microscopy by solving the electron transport equation
Müller, E.; Hugenschmidt, M.; Gerthsen, D.
2020. Physical review research, 2 (4), Art.-Nr.: 043313. doi:10.1103/PhysRevResearch.2.043313

Direct Synthesis of ZIF-8 on Transmission Electron Microscopy Grids Allows Structure Analysis and 3D Reconstruction
Hugenschmidt, M.; Kutonova, K.; Valadez Sánchez, E. P.; Moulai, S.; Gliemann, H.; Bräse, S.; Wöll, C.; Gerthsen, D.
2020. AgBioForum, 37 (11), Art.-Nr.: 2000209. doi:10.1002/ppsc.202000209

Quantification of the thickness of TEM samples by low-energy scanning transmission electron microscopy
Hugenschmidt, M.; Müller, E.; Gerthsen, D.
2015, September 8. Microscopy Conference (MC 2015 2015), Göttingen, Deutschland, 6.–11. September 2015

Beam broadening measured in transmission mode at low electron energies in a scanning electron microscope
Hugenschmidt, M.; Müller, E.; Gerthsen, D.
2019, September 4. Microscopy Conference (MC 2019), Berlin, Deutschland, 1.–5. September 2019

Differential electron scattering cross-sections at low electron energies: The influence of screening parameter
Čalkovský, M.; Müller, E.; Hugenschmidt, M.; Gerthsen, D.
2019. Ultramicroscopy, 207, Article No.112843. doi:10.1016/j.ultramic.2019.112843

Electron beam broadening in electron‐transparent samples at low electron energies
Hugenschmidt, M.; Müller, E.; Gerthsen, D.
2019. Journal of microscopy, 274 (3), 150–157. doi:10.1111/jmi.12793